25 November 2016

Simulated Aided Testing/Simulation Guided Testing (SAT/SGT)

There are many standards on environmental conditions and how to simulate and accelerate these conditions in Durability-Reliability demonstrations testing, especially for Electrical/Electronic (E/E) products.


Physical test to field correlation projects typically require at least 2-3 years of expensive effort. A faster approach is now possible through Physics of Failure (PoF) research that has produced math models of aging-wear out mechanisms of components and materials based on the Material Science principles of Stress Driven Damage Accumulation in Materials. The models of these principles are used to determine the rate and accumulated amounts of damage accumulation and when the failure point of an item is reached. These models can be used in a Computer Aided Engineering (CAE) durability-reliability simulation to determine the reliability of products as they age under various field or test usage and environmental conditions. These models can be used in an analysis process known as Simulation Aided Testing (SAT) to (translate or extrapolate or project or correlate) durability test results to field condition. The inverse of this process where a PoF durability simulation of in service field conditions is used to design an accelerated life test is known as Simulated Guided Testing (SGT).


This webinar will provide an over view of SAT/SGT analysis method with examples of how to apply the technique to accelerated thermal cycling life testing of electronic products.




James McLeish



Thursday the 15th of December 2016
11.00 AM EST or 2:00 PM EST






Use the form to register for the Simulated Aided Testing/Simulation Guided Testing (SAT/SGT) webinar.





Use the form to register for the Simulated Aided Testing/Simulation