08 April 2016

Understanding and Mitigating EOS/ESD in Electronics

Electro-Static-Discharge (ESD) or Electrical Overstress (EOS) related failures can have a significant impact on your product’s life expectancy and reliability. ESD is the sudden flow of electricity between conductive and a non-conductive surfaces that builds an electric charge and then discharges it to ground, impacting any susceptible electronics in the path. For example, a person walking across a carpet and then touching a door know can discharge as much as 15000V (65-90% humidity) which is usually above the threshold for most electronic components, yet does not hurt the human involved. Conversely, EOS failures are due to an overstress in a system either from a surge or overload on the circuitry. These failures exhibit much more damage due to the level of current or voltage incurred.

This webinar will distinguish between the two failure modes and provide insight into what you need to do to protect your circuitry and deliver a reliable product.




Understanding and Mitigating EOS/ESD in Electronics


Greg Caswell and Ed Wyrwas



Thursday the 28th of April 2016

5:00 PM - 6.30 PM CEST

8:00 PM - 9.30 PM CEST