Calibre Design for Manufacturing

At nanometer nodes, design sign-off requires more than DRC & LVS. Calibre DFM yield analysis, printability, and performance validation tools provide layout modifications and design flow-based yield-enhancing operations, and ensure IC design optimization, performance, and reliability.

Calibre Design for Manufacturing

The Calibre Design for Manufacturing (DFM) tool suite provides an expansive set of yield analysis solutions that account for random, systematic, and parametric yield loss. These analysis solutions are the basis for automated layout enhancements that improve printability and performance. The Calibre tools enable a wide variety of smart design optimizations for both yield and reliability without sacrificing area.

Calibre DFM tools deliver foundry know-how upstream to design engineers, empowering them to design for optimal performance, manufacturability, and yield.

Calibre YieldEnhancer with SmartFill

OPTIMIZED LAYOUT MODIFICATION

The Calibre YieldEnhancer tool is an analysis-based layout modification platform providing an automated analysis-based approach to layout enhancements that help improve yield without sacrificing area.

Calibre YieldEnhancer SmartFill technology addresses new fill challenges at advanced process nodes, including multi-patterning and an ECO fill flow.

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Calibre YieldAnalyzer

CAA AND DFM SCORING

The Calibre YieldAnalyzer tool provides comprehensive methods to analyze design manufacturability and reliability, including critical area analysis, DFM scoring, and via redundancy checking.

It examines a layout and scores the design for both critical area analysis and DFM scoring. The intuitive interfaces helps designers analyze the results so they know what, where and how they can most improve their designs for manufacturability.

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Calibre CMPAnalyzer

REDUCE PLANARITY VARIATION

The Calibre CMPAnalyzer tool enables designers to examine a variety of CMP effects and determine the optimum modifications for improving performance and yield.

Planarity variation creates hotspots that impact both chip manufacturability and the electrical performance of the design. The Calibre CMPAnalyzer tool examines a layout and simulates the thickness of each layer to enable designers to intelligently modify the design to reduce variation effects.

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Calibre LFD

REDUCE PROCESS VARIABILITY

The Calibre LFD tool captures a design’s response to manufacturing process effects, enabling engineers to fix hotspots, variability, and reliability issues before tape-out

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