At nanometer nodes, design sign-off requires more than DRC & LVS. Calibre DFM yield analysis, printability, and performance validation tools provide layout modifications and design flow-based yield-enhancing operations, and ensure IC design optimization, performance, and reliability.
Calibre Design for Manufacturing
Calibre YieldEnhancer with SmartFill
OPTIMIZED LAYOUT MODIFICATION
The Calibre YieldEnhancer tool is an analysis-based layout modification platform providing an automated analysis-based approach to layout enhancements that help improve yield without sacrificing area.
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Calibre YieldAnalyzer
CAA AND DFM SCORING
The Calibre YieldAnalyzer tool provides comprehensive methods to analyze design manufacturability and reliability, including critical area analysis, DFM scoring, and via redundancy checking.
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Calibre CMPAnalyzer
REDUCE PLANARITY VARIATION
The Calibre CMPAnalyzer tool enables designers to examine a variety of CMP effects and determine the optimum modifications for improving performance and yield.
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Calibre LFD
REDUCE PROCESS VARIABILITY
The Calibre LFD tool captures a design’s response to manufacturing process effects, enabling engineers to fix hotspots, variability, and reliability issues before tape-out
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