At nanometer nodes, design sign-off requires more than DRC & LVS. Calibre DFM yield analysis, printability, and performance validation tools provide layout modifications and design flow-based yield-enhancing operations, and ensure IC design optimization, performance, and reliability.
Calibre Design for Manufacturing
Calibre YieldEnhancer with SmartFill
OPTIMIZED LAYOUT MODIFICATION
The Calibre YieldEnhancer tool is an analysis-based layout modification platform providing an automated analysis-based approach to layout enhancements that help improve yield without sacrificing area.
View Fact Sheet
--
Calibre YieldAnalyzer
CAA AND DFM SCORING
The Calibre YieldAnalyzer tool provides comprehensive methods to analyze design manufacturability and reliability, including critical area analysis, DFM scoring, and via redundancy checking.
View Fact Sheet
--
Calibre CMPAnalyzer
REDUCE PLANARITY VARIATION
The Calibre CMPAnalyzer tool enables designers to examine a variety of CMP effects and determine the optimum modifications for improving performance and yield.
View Fact Sheet
--
Calibre LFD
REDUCE PROCESS VARIABILITY
The Calibre LFD tool captures a design’s response to manufacturing process effects, enabling engineers to fix hotspots, variability, and reliability issues before tape-out
View Fact Sheet
--
READY TO TALK TO SOMEONE TODAY?
We're standing by to answer your questions.